DFT Guide

... because Design For Testability is important

Home

DFT Guidelines

DFT Guidelines for JTAG/Boundary Scan

This website presents various Design For Testability guideline for JTAG/Boundary Scan. This test technology, standardized as IEEE 1149.1 - and expanded with new standards such as IEEE 1149.4 and IEEE 1149.6 - provides a powerful means to access device, board, and system level circuitry, enabling applications such as connectivity tests, on-board and in-system configuration and programming, and even simple functional tests and/or debugging and emulation.

Chip level DFT Guidelines ( 5 Articles )
Board level DFT Guidelines ( 10 Articles )
System level DFT Guidelines ( 1 Articles )
DFT References ( 2 Articles )

Main Menu

GOEPEL Electronics

RSS Feed

GOEPEL electronic presents OptiCon TurboLine, an AOI system for the high-end inspection during large volume production that ensures superior quality for high value PCBs. Based on exceptional system features it sets new standards in terms of fault detection, test speed and flexibility.