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Board and Module Level DFT Guidelines

FPGA driven Memory Access Tests

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Complex FPGA devices typically provide banks of I/O pins that can be configured for a certain logic family (voltage levels and other I/O parameters are programmable/configurable per I/O banks). Typically such devices has reference voltage pins per I/O bank. When the FPGA is not configured, the I/O banks default to a preset logic family, e.g. LVTTL.

 

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JTAG/Boundary Scan performance considerations

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Some JTAG/Boundary Scan applications require only a small number of test vectors and therefore don't put any particular requirement on the performance/throughput of the JTAG test bus. Other applications, such as in-system programming of FLASH devices, though, rely on many thousands or even millions of shift vectors. For such applications, the test bus throughput has a very big impact on overall test execution times. 
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JTAG/Boundary Scan related PCB layout guidelines

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The layout of the JTAG test bus signal traces on the printed circuit board (PCB) is very important to ensure good signal quality. Especially the TCK signal needs to be as free as possible of glitches and spikes, since all test access port (TAP) operations are triggered by rising and falling TCK edges.
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Improving the Boundary Scan test coverage

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The test coverage achievable on a board/module or system with Boundary Scan depends on the available Boundary Scan resources (e.g. type and number of Boundary Scan cells connected to a particular net) as well as on the implementation of design for testability considerations at the board and system level.
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Compliance Enable and Mode Control pins

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Some IEEE 1149.x compliant devices have so-called Compliance Enable pins, used to enable IEEE 1149.x compliant device features. It is very important to properly accommodate such pins on the board design to ensure that Boundary Scan applications are not obstructed.
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