IEEE Standards related to DFT
BSDL
The Boundary Scan Description Language (BSDL), as defined in IEEE 1149.1, Annex B, is used to document the Boundary Scan resources available in a particular IC and to present that information to software tools in a machine readable form for automated processing.
Practically all Boundary Scan tools read and analyze BSDL files in order to undertand which test modes are supported by the device and which Boundary Scan cell must be used to toggle a particular pin, for example. More sophisticated tools use BSDL files in conjunction with CAD data (e.g. the netlist of the Unit Under Test) for automated test generation.
GOEPEL Electronics
At the SMT/Hybrid/Packaging trade show GOEPEL electronic, a world-class vendor of JTAG/Boundary Scan solutions compliant with the IEEE Std.1149.x, officially announces the introduction of the CION Module™/SO-DIMM200 to the market as another I/O module of the CION product family. |
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