DFT Guide

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IEEE Standards related to DFT

SJTAG

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At the IEEE European Board Test Workshop held in Tallinn, Estonia, May 2005, a group of 14 board test professionals met to discuss a common set of problems associated with the extended test and configuration use of 1149.1 boundary-scan infrastructure within complex multi-board systems. As a result of this discussion, it was decided to create a system-level JTAG initiative, called System JTAG (SJTAG). 

SJTAG Mission

The goal for SJTAG is: For all variants of XBST and EBST, to define the data contents and formats communicated between external Test Manager platforms and internal Embedded Test Controllers, and between ETCs and the UUTs they serve in an open-standard, vendor-independent and non-proprietary way.
[from the STAG website
 

Jena, Germany; Las Vegas, NV – At the APEX tradeshow, GÖPEL electronic, a worldwide leading vendor of JTAG/Boundary Scan solutions compliant to IEEE1149.x, introduces a brand-new I/O module called CION Module™/FXT114S. 
 
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