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IEEE Standards related to DFT

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STAPL Summary

IEEE Standards related to DFT

STAPL Summary

Sunday, 10 August 2008 02:15

The Standard Test And Programming Language is primarily used for device programming (for PLD and FPGA devices) through a IEEE 1149.1 compliant

Test Access Port. However, there are some tools that utilize the language for test applications. STAPL provides improvements over SVF (such as conditional branching and looping, etc). STAPL is also looked at by various initiatives (such as IEEE P1687 and SJTAG) in regard to its feasability for other purposes.

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GOEPEL Electronics

GOEPEL electronic’s TESSY extended is a fully automated electronic functional test system for the production of electronic devices in vehicles. TESSY extended supports EOL tester lines (EOL = End of Line) with cross-linked test cells, from Ident-Scan of the 2-D code via multiple parallel test to laser marking and sorting of faulty parts – for quantities of more than one million devices.